Advanced photon and particle techniques for the characterization of defects in solids :  symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. / 
editors, J. B. Roberto, R. W. Carpenter, M. C. Wittels 
 - Pittsburgh, Pa. :  Materials Research Society,  c1985 
 - xi, 390 p. :  ill. ;  24 cm. 
 - Materials Research Society symposia proceedings ;  v. 41 .
 - Materials Research Society symposia proceedings .
<br/><br/>Includes bibliographies and index 
<br/><br/><label>ISBN: </label>9780931837067 0931837065 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects--Congresses<br/>Electron microscopy--Congresses<br/>Proton beams--Congresses<br/>Particle beams--Congresses