01035nam a2200265 a 4500001001400000003000700014005001700021008004100038020001800079020001500097040000800112245021800120260005800338300003300396490006100429504003800490650003400528650003600562650002900598650003100627700001900658700002100677700001900698830005200717vtls000060071KUKTEM20251117145447.0120522t1985    paua   f b    101 0 eng d  a9780931837067  a0931837065  aUMP10aAdvanced photon and particle techniques for the characterization of defects in solids :bsymposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. /ceditors, J. B. Roberto, R. W. Carpenter, M. C. Wittels  aPittsburgh, Pa. :bMaterials Research Society,cc1985  axi, 390 p. :bill. ;c24 cm.1 aMaterials Research Society symposia proceedings ;vv. 41  aIncludes bibliographies and index 0aCrystalsxDefectsvCongresses 0aElectron microscopyvCongresses 0aProton beamsvCongresses 0aParticle beamsvCongresses1 aRoberto, J. B.1 aCarpenter, R. W.1 aWittels, M. C. 0aMaterials Research Society symposia proceedings