Rong, Yonghua <br/><br/>
Characterization of microstructures by analytical electron microscopy (AEM) / 
Yonghua Rong 
 - Berlin :  Beijing :  Springer ;  Higher Education Press,  c2012 
 - xviii, 552 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783642201189 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials--Nondestructive testing<br/>Electron microscopy