00848nam a2200229 a 4500 vtls000059924 KUKTEM 20251117145454.0 120522t2012 gw a f b 001 0 eng d 9783642201189 201207171609 jamie 201205221035 farina UMP TA417.23 .R66 2012 Rong, Yonghua Characterization of microstructures by analytical electron microscopy (AEM) / Yonghua Rong Berlin : Springer ; Beijing : Higher Education Press, c2012 xviii, 552 p. : ill. ; 24 cm. Includes bibliographical references and index Nanostructured materials Nondestructive testing Electron microscopy 0 0 0 0 20000 20000 2019-09-04 461.39 0 TA417.23 .R66 2012 0000065694 2019-09-04 00:00:00 1 461.39 2019-09-04 OPEN VIRTUA40 46932 46938 VTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*9992