TY  - BOOK
AU  - Rong,Yonghua
TI  - Characterization of microstructures by analytical electron microscopy (AEM)
SN  - 9783642201189
PY  - 2012///
CY  - Berlin, Beijing
PB  - Springer, Higher Education Press
KW  - Nanostructured materials
KW  - Nondestructive testing
KW  - Electron microscopy
N1  - Includes bibliographical references and index
ER  -