Power-aware testing and test strategies for low power devices / 
Patrick Girard, Nicola Nicolici, Xiaoqing Wen, editors 
 - New York :  Springer,  2010 
 - xxiii, 363 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781441909275 1441909273 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Low voltage integrated circuits--Power supply<br/>Low voltage integrated circuits--Testing