Pecharsky, Vitalij K. <br/><br/>
Fundamentals of powder diffraction and structural characterization of materials / 
Vitalij K. Pecharsky, Peter Y. Zavalij 
 - 2nd ed. 
 - New York :  Springer,  c2009 
 - xxiii, 741 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780387095783 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-rays--Diffraction--Measurement<br/>Powders--Optical properties--Measurement<br/>X-ray crystallography