00743nam a2200217 a 4500001001400000003000700014005001700021008004100038020002500079040000800104100002600112245012600138250001200264260003300276300003600309504005000345650003700395650004500432650002600477700002200503vtls000041493KUKTEM20251117145546.0090817t2009    nyua   f      001 0 eng d  a9780387095783 (pbk.)  aUMP1 aPecharsky, Vitalij K.10aFundamentals of powder diffraction and structural characterization of materials /cVitalij K. Pecharsky, Peter Y. Zavalij  a2nd ed.  aNew York :bSpringer,cc2009  axxiii, 741 p. :bill. ;c24 cm.  aIncludes bibliographical references and index 0aX-raysxDiffractionxMeasurement 0aPowdersxOptical propertiesxMeasurement 0aX-ray crystallography1 aZavalij, Peter Y.