Applied survival analysis : regression modeling of time-to-event data /
David W. Hosmer, Stanley Lemeshow, Susanne May
- 2nd ed.
- Hoboken ,NJ : Wiley-Interscience, c2008
- xiii, 392 p. : ill. ; 25 cm.
- Wiley series in probability and statistics .
Includes bibliographical references (p. 365-381) and index