Trace analysis with nanomaterials / 
edited by David T. Pierce and Julia Xiaojun Zhao 
 - Weinheim, Germany :  Wiley-VCH Verlag GmbH ,  2009 
 - xxi, 396 p. :  ill. (some col.) ;  25 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>3527323503 9783527323500 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Trace analysis<br/>Nanostructured materials