Measurement and modeling of silicon heterostructure devices / 
edited by John D. Cressler 
 - Boca Raton, FL :  CRC Press,  c2008 
 - 1 v. (various pagings) :  ill. ;  27 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781420066920 (alk. paper) 1420066927 (alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bipolar transistors--Mathematical models<br/>Bipolar transistors<br/>Heterostructures<br/>Integrated circuits--Design and construction