TY  - BOOK
AU  - Cressler,John D.
TI  - Measurement and modeling of silicon heterostructure devices
SN  - 9781420066920 (alk. paper)
PY  - 2008///
CY  - Boca Raton, FL
PB  - CRC Press
KW  - Bipolar transistors
KW  - Mathematical models
KW  - Heterostructures
KW  - Integrated circuits
KW  - Design and construction
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/toc/ecip0723/2007030737.html
ER  -