In-situ electron microscopy at high resolution / 
editor, Florian Banhart 
 - Singapore ;  Hackensack, NJ :  World Scientific,  c2008 
 - vi, 311 p. :  ill. (some col.) ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9789812797339 9812797335 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy--Technique<br/>High resolution electron microscopy