Claeys, Cor

Extended defects in germanium: fundamental and technological aspects/ Cor Claeys & Eddy Simoen - Berlin: Springer , c2009 - xx, 297 p. : ill. ; 25 cm. - Springer series in materials science, 118 0933-033X ; . - Springer series in materials science ; v. 118 .

Includes bibliographical references and index

9783540856115


Germanium
Semiconductors--Defects
Electrical engineering