01063nam a2200277 a 4500 vtls000036906 KUKTEM 20251117150115.0 090528t2009 gw a f 001 0 eng d 9783540856115 201107132315 VLOAD 201004281029 Fida 200908141619 VLOAD 200908141552 VLOAD 200905280956 training UMP TA480.G4 C53 2009 Claeys, Cor Extended defects in germanium: fundamental and technological aspects/ Cor Claeys & Eddy Simoen Berlin: Springer , c2009 xx, 297 p. : ill. ; 25 cm. Springer series in materials science, 0933-033X ; 118 Includes bibliographical references and index Germanium Semiconductors Defects Electrical engineering Simoen, Eddy Springer series in materials science ; v. 118 0 0 0 0 10000 10000 2019-09-04 661.45 0 TA480.G4 C53 2009 0000044679 2019-09-04 00:00:00 1 661.45 2019-09-04 OPEN VIRTUA40 51529 51535 VTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*6502*7000*8300*9991