Advanced mathematical & computational tools in metrology & testing VIII/ 
editors, F. Pavese ... [et al.] 
 - New Jersey :  World Scientific ,  2009 
 - xii, 406 p. :  ill. ;  24 cm. 
 - Series on advances in mathematics for applied sciences ;  v. 78 .
 - Series on advances in mathematics for applied sciences ;  v. 78. .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9789812839510 9812839518 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Measurement--Congresses<br/>Physical measurements--Congresses.<br/>Metrology--Congresses.