00892nam a2200241 a 4500001001400000003000700014005001700021008004100038020001800079020001500097040000800112111004300120245011000163260004300273300003400316490006800350504005000418650002800468650003900496650002700535700001900562830006900581vtls000041037KUKTEM20251117150118.0090804t2009    njua   f      001 0 eng d  a9789812839510  a9812839518  aUMP2 aAMCTM VIIId(2008 : œcParis, France)10aAdvanced mathematical & computational tools in metrology & testing VIII/ceditors, F. Pavese ... [et al.]  aNew Jersey :bWorld Scientific ,c2009  axii, 406 p. :bill. ;c24 cm.1 aSeries on advances in mathematics for applied sciences ;vv. 78  aIncludes bibliographical references and index 0aMeasurementvCongresses 0aPhysical measurementsvCongresses. 0aMetrologyvCongresses.1 aPavese, Franco 0aSeries on advances in mathematics for applied sciences ;vv. 78.