Epstein,  Benjamin <br/><br/>
Mathematical models for systems reliability / 
Benjamin Epstein and Ishay Weissman 
 - Boca Raton :  CRC Press ,  c2008 
 - 253 p. :  ill. ;  25 cm 
<br/><br/> "A Chapman & Hall book." 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781420080827 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering)--Mathematics<br/>System failures (Engineering)--Mathematical models