Advanced nondestructive evaluation II :  proceedings of the International Conference on ANDE 2007, the 2nd International Conference on Advanced Nondestructive Testing / 
editors, Seung-Seok Lee ... [et al.] 
 - Singapore ;  Hackensack, N.J. :  World Scientific,  c2008 
 - 2 v. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references 
<br/><br/><label>ISBN: </label>9789812790163 (set) 9812790160 (set) 9789812790170 (vol. 1) 9812790179 (vol. 1) 9789812790187 (vol. 2) 9812790187 (vol. 2) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nondestructive testing--Congresses<br/>Materials science--Congresses