Taur, Yuan <br/><br/>
Fundamentals of modern VLSI devices / 
Yuan Taur, Tak H. Ning 
 - 2nd ed. 
 - Cambridge, UK ;  New York :  Cambridge University Press,  2009 
 - xxiii, 656 p. :  ill. ;  26 cm. 
<br/><br/> First paperback edition 2013 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780521832946 (hbk.) 9781107635715 (pbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary<br/>Bipolar transistors<br/>Integrated circuits--Very large scale integration