Sirohi, R. S. <br/><br/>
Optical methods of measurement :  wholefield techniques / 
Rajpal S. Sirohi 
 - 2nd ed. 
 - Boca Raton :  CRC Press,  c2009 
 - xxvi, 290 p. :  ill. ;  25 cm. 
 - Optical science and engineering ;  146 .
 - Optical science and engineering (Boca Raton, Fla.) ;  146 .
<br/><br/>Includes bibliographical references and index 
<br/><br/>Waves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon 
<br/><br/><label>ISBN: </label>9781574446975 (hardcover : alk. paper) 1574446975 (hardcover : alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical measurements