00981nam a2200229 a 4500001001400000003000700014005001700021008004100038020004300079020004000122040000800162100001800170245008000188250001200268260003600280300003500316490004300351504005000394505022000444650002500664830006200689vtls000043466KUKTEM20251117150331.0090908t2009    flua   f b    001 0 eng d  a9781574446975 (hardcover : alk. paper)  a1574446975 (hardcover : alk. paper)  aUMP1 aSirohi, R. S.10aOptical methods of measurement :bwholefield techniques /cRajpal S. Sirohi  a2nd ed.  aBoca Raton :bCRC Press,cc2009  axxvi, 290 p. :bill. ;c25 cm.1 aOptical science and engineering ;v146  aIncludes bibliographical references and index0 aWaves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon 0aOptical measurements 0aOptical science and engineering (Boca Raton, Fla.) ;v146