Materials reliability in microelectronics III :  symposium held April 12-15, 1993, San Francisco, California, U.S.A. / 
editors by Kenneth P. Rodbell ... [et al.] 
 - Pittsburgh, PA :  Materials Research Society,  c1993 
 - xi, 497 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings ;  v. 309 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781558992054 1558992057 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Reliability--Congresses<br/>Microelectronics--Materials--Testing--Congresses<br/>Electrodiffusion--Congresses<br/>Microstructure--Congresses--Congresses