01153nam a2200277 a 4500 vtls000061986 KUKTEM 20251117150358.0 120615t1993 paua f b 001 0 eng d 9781558992054 1558992057 201307101455 jamie 201206151048 safura UMP TK7874 .M38 1993 Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. / editors by Kenneth P. Rodbell ... [et al.] Pittsburgh, PA : Materials Research Society, c1993 xi, 497 p. : ill. ; 24 cm. Materials Research Society symposium proceedings ; v. 309 Includes bibliographical references and index Microelectronics Reliability Congresses Microelectronics Materials Testing Congresses Electrodiffusion Congresses Microstructure Congresses Congresses Rodbell, Kenneth P. 0 0 0 0 20000 20000 2019-09-04 103.77 0 TK7874 .M38 1993 0000075113 2019-09-04 00:00:00 1 103.77 2019-09-04 OPEN VIRTUA40 57149 57155 VTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*9992