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  <titleInfo>
    <nonSort>A </nonSort>
    <title>signal integrity engineer's companion</title>
    <subTitle>real-time test and measurement and design simulation</subTitle>
  </titleInfo>
  <name type="personal">
    <namePart>Lawday, Geoff</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <name type="personal">
    <namePart>Ireland, David</namePart>
  </name>
  <name type="personal">
    <namePart>Edlund, Greg</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="code" authority="marccountry">nju</placeTerm>
    </place>
    <place>
      <placeTerm type="text">Upper Saddle River, NJ</placeTerm>
    </place>
    <publisher>Prentice Hall</publisher>
    <dateIssued>c2008</dateIssued>
    <dateIssued encoding="marc">2008</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
  </language>
  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>xxxi, 460 p. : ill. ; 25 cm.</extent>
  </physicalDescription>
  <tableOfContents>Chip-to-chip timing and simulation -- Signal path analysis as a signal integrity -- DDR2 case study -- Real-time measurements : probing -- Testing and debugging : oscilloscopes and logic analysers -- Replicating real-world signals with signal sources -- Signal analysis and compliance -- PCI express case study -- The wireless signal</tableOfContents>
  <targetAudience authority="marctarget">specialized</targetAudience>
  <note type="statement of responsibility">Geoff Lawday, David Ireland, and Greg Edlund</note>
  <note>Includes index</note>
  <subject authority="lcsh">
    <topic>Electronic apparatus and appliances</topic>
    <topic>Testing</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Electronic apparatus and appliances</topic>
    <topic>Design and construction</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Signal processing</topic>
    <topic>Simulation methods</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Switching circuits</topic>
    <topic>Reliability</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Oscillators, Electric</topic>
    <topic>Testing</topic>
  </subject>
  <subject authority="lcsh">
    <topic>Signal integrity (Electronics)</topic>
  </subject>
  <relatedItem type="series">
    <titleInfo>
      <title>Prentice Hall modern semiconductor design series</title>
    </titleInfo>
  </relatedItem>
  <identifier type="isbn">0131860062 (pbk. : alk. paper)</identifier>
  <identifier type="isbn">9780131860063</identifier>
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    <recordCreationDate encoding="marc">081202</recordCreationDate>
    <recordChangeDate encoding="iso8601">20251117150432.0</recordChangeDate>
    <recordIdentifier source="KUKTEM">vtls000033324</recordIdentifier>
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