X-Rays in nanoscience :  spectroscopy, spectromicroscopy, and scattering techniques / 
edited by Jinghua Guo 
 - Weinheim, GER :  Wiley-VCH,  2010 
 - xii, 263 p. :  ill. ;  25 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783527322886 3527322884 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials<br/>X-ray microanalysis