Optical microstructural characterization of semiconductors :  symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / 
editors, M. Selim Unlu ... [et al.] 
 - Warrendale, PA :  Materials Research Society,  2000 
 - xi, 333 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings  ;  v. 588 .
 - Materials Research Society symposium proceedings ;  v. 588 .
<br/><br/>Includes bibliographical references and indexes 
<br/><br/><label>ISBN: </label>9781558994966 1558994963 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Congresses<br/>Microstructure--Congresses