00859nam a2200217 a 4500001001400000003000700014005001700021008004100038020001800079020001500097040000800112245017200120260005600292300003300348490006400381504005200445650003100497650003100528700001900559830006300578vtls000062376KUKTEM20251125093045.0120619t2000       da  g      001 0 eng d  a9781558994966  a1558994963  aUMP00aOptical microstructural characterization of semiconductors :bsymposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. /ceditors, M. Selim Unlu ... [et al.]  aWarrendale, PA :bMaterials Research Society,c2000  axi, 333 p. :bill. ;c24 cm.1 aMaterials Research Society symposium proceedings  ;vv. 588  aIncludes bibliographical references and indexes 0aSemiconductorsvCongresses 0aMicrostructurevCongresses1 aUnlu, M. Selim 0aMaterials Research Society symposium proceedings ;vv. 588