TY  - BOOK
AU  - Unlu,M.Selim
TI  - Optical microstructural characterization of semiconductors: symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. 
T2  - Materials Research Society symposium proceedings
SN  - 9781558994966
PY  - 2000///
CY  - Warrendale, PA
PB  - Materials Research Society
KW  - Semiconductors
KW  - Congresses
KW  - Microstructure
N1  - Includes bibliographical references and indexes
ER  -