Atomic force microscopy based nanorobotics :  modelling, simulation, setup building and experiments / 
Hui Xie ... [et al.] 
 - Berlin :  Springer,  c2011 
 - xiv, 342 p. :  ill. (some col.) ;  24 cm. 
 - Springer tracts in advanced robotics,  v. 71  1610-7438 ; .
 - Springer tracts in advanced robotics ;  v. 71 .
<br/><br/>Includes bibliographical references 
<br/><br/>Introduction -- Descriptions and Challenges of AFM Based Nanorobotic Systems -- Instrumentation Issues of an AFM Based Nanorobotic System -- Nanomechanics of AFM Based Nanomanipulation -- Teleoperation Based AFM Manipulation Control -- Automated Control of AFM Based Nanomanipulation -- Applications of AFM Based Nanorobotic Systems 
<br/><br/><label>ISBN: </label>9783642203282 3642203280 9783642203299 (electronic bk.) 3642203299 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Robotics<br/>Microrobots<br/>Atomic force microscopy