TY  - BOOK
AU  - Xie,Hui
TI  - Atomic force microscopy based nanorobotics: modelling, simulation, setup building and experiments 
T2  - Springer tracts in advanced robotics,
SN  - 9783642203282
PY  - 2011///
CY  - Berlin
PB  - Springer
KW  - Robotics
KW  - Microrobots
KW  - Atomic force microscopy
N1  - Includes bibliographical references; Introduction -- Descriptions and Challenges of AFM Based Nanorobotic Systems -- Instrumentation Issues of an AFM Based Nanorobotic System -- Nanomechanics of AFM Based Nanomanipulation -- Teleoperation Based AFM Manipulation Control -- Automated Control of AFM Based Nanomanipulation -- Applications of AFM Based Nanorobotic Systems
ER  -