01016nam a2200253 a 4500001001400000003000700014005001700021008004100038020001800079020001500097040000800112245016300120260005700283300003300340490006300373504005000436650004600486650005300532650004300585650002800628700002200656710003100678830005300709vtls000061991KUKTEM20251125093101.0120615t1995    paua   f b    001 0 eng d  a9781558992948  a1558992944  aUMP00aMaterials reliability in microelectronics V :bsymposium held April 17-21, 1995, San Francisco, California, U.S.A. /ceditors by Anthony S. Oates ... [et al.]  aPittsburgh, PA :bMaterials Research Society,cc1995  axv, 523 p. :bill. ;c24 cm.1 aMaterials Research Society symposium proceedings ;vv. 391  aIncludes bibliographical references and index 0aMicroelectronicsxReliabilityxCongresses 0aMicroelectronicsxMaterialsxTestingxCongresses 0aMicrostructurexCongressesvCongresses 0aMetallizingxCongresses1 aOates, Anthony S.2 aMaterials Research Society 0aMaterials Research Society symposium proceedings