Advances in surface and thin film diffraction :  symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. / 
editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham 
 - Pittsburgh, Pa. :  Materials Research Society,  c1991 
 - xiii, 367 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings,  v. 208  0272-9172 ; .
 - Materials Research Society symposia proceedings ;  v. 208 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781558991002 155899100X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films--Surfaces--Surfaces--Congresses<br/>Thin films--Optical properties--Congresses<br/>Diffraction--Congresses