02738nam a2200325 a 4500 vtls000051861 KUKTEM 20251125093118.0 110311t2011 njua f 001 0 eng d 9780470250020 201206081005 asmadi 201205251043 asmadi 201107131641 VLOAD 201103111002 irma UMP TK7870.23 .S84 2011 Suhir, Ephraim Structural dynamics of electronic and photonic systems / edited by Ephraim Suhir, David S. Steinberg, T. X. Yu Hoboken, N.J. : Wiley, 2011 x, 598 p. : ill. ; 25 cm. Includes bibliographical references and index "The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer’s viewpoint will be conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice"-- Provided by publisher "The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"-- Provided by publisher Electronic apparatus and appliances Reliability Optoelectronic devices Reliability Fault tolerance (Engineering) Microstructure Structural dynamics Suhir, Ephraim Yu, T. X. Steinberg, Dave S. 0 0 0 0 20000 20000 2019-09-04 531.18 0 TK7870.23 .S84 2011 0000065042 2019-09-04 00:00:00 1 531.18 2019-09-04 OPEN VIRTUA40 61504 61510 VTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*5200*5201*6500*6501*6502*6503*6504*7000*7001*7002*9991