Information Modeling for Interoperable Dimensional Metrology / 
Yaoyao (Fiona) Zhao ... [et  al.] 
 - New York :  Springer,  2011 
 - xix, 367 p. :  ill. ;  24 cm. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9781447121664 
<br/><br/><label>Subjects--Topical Terms: </label><br/>CAD/CAM systems<br/>Computer integrated manufacturing systems