01743nam a2200325 a 4500 vtls000060670 KUKTEM 20251125093332.0 120531t2009 paua f 001 0 eng d 9781605111285 1605111287 201301310934 saini 201205311005 safura 201205311004 safura UMP TK7871.99.M44 C56 2009 CMOS gate-stack scaling-- materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A. / editors, Alexander A. Demkov ... [et al.] Warrendale, Pa. : Materials Research Society, 2009 viii, 179 p. : ill. ; 24 cm. Materials Research Society symposium proceedings v. 1155 " ... Symposium C, ’CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,’ held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- Preface Includes bibliographical references and indexes Metal oxide semiconductors, Complementary Congresses Metal oxide semiconductors Materials Congresses Silicides Congresses Gate array circuits Congresses Demkov, Alexander A. Materials Research Society. Meeting (2009 : San Francisco, Calif.) Symposium C, "CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications" (2009 : San Francisco, Calif.) Materials Research Society symposium proceedings v. 1155 0 0 0 0 20000 20000 2019-09-04 345.67 0 TK7871.99.M44 C56 2009 0000068200 2019-09-04 00:00:00 1 345.67 2019-09-04 OPEN VIRTUA40 63757 63763 VTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5000*5040*6500*6501*6502*6503*7000*7100*7110*8300*9992