Materials reliability in microelectronics VI :  symposium held April 8-12, 1996, San Francisco, California, U.S.A. / 
editors by William F. Filter ... [et al.] 
 - Pittsburgh, PA :  Materials Research Society,  c1996 
 - xv, 583 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings ;  v. 428 .
 - Materials Research Society symposium proceedings .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781558993310 1558993312 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Reliability--Congresses<br/>Microelectronics--Materials--Testing--Congresses<br/>Microstructure--Congresses--Congresses<br/>Metallizing--Congresses