TY  - BOOK
AU  - Filter,William F.
ED  - Materials Research Society
TI  - Materials reliability in microelectronics VI: symposium held April 8-12, 1996, San Francisco, California, U.S.A. 
T2  - Materials Research Society symposium proceedings
SN  - 9781558993310
PY  - 1996///
CY  - Pittsburgh, PA
PB  - Materials Research Society
KW  - Microelectronics
KW  - Reliability
KW  - Congresses
KW  - Materials
KW  - Testing
KW  - Microstructure
KW  - Metallizing
N1  - Includes bibliographical references and index
ER  -