High resolution electron microscopy of defects in materials :  symposium held April 16-18, 1990, San Francisco, California, U.S.A. / 
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen 
 - Pittsburgh, Pa. :  Materials Research Society,  1990 
 - xi, 391 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings,  v. 183  0272-9172 ; .
 - Materials Research Society symposia proceedings ;  v. 183 .
<br/><br/>Includes bibliographical references and indexes 
<br/><br/><label>ISBN: </label>9781558990722 1558990720 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy--Congresses<br/>Materials--Defects--Congresses<br/>High resolution electron microscopy--Congresses