01326nam a2200313 a 4500 vtls000061649 KUKTEM 20251125093536.0 120611t1990 paua f 001 0 eng d 9781558990722 1558990720 201304021151 saini 201206111151 safura UMP TA417.23 .H54 1990 High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen Pittsburgh, Pa. : Materials Research Society, 1990 xi, 391 p. : ill. ; 24 cm. Materials Research Society symposium proceedings, 0272-9172 ; v. 183 Includes bibliographical references and indexes Materials Microscopy Congresses Materials Defects Congresses High resolution electron microscopy Congresses Sinclair, Robert Smith, David J. Dahmen, Ulrich Materials Research Society Materials Research Society symposia proceedings ; v. 183 0 0 0 0 20000 20000 2019-09-04 103.77 0 TA417.23 .H54 1990 0000071757 2019-09-04 00:00:00 1 103.77 2019-09-04 OPEN VIRTUA40 65652 65658 VTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*7000*7001*7002*7100*8300*9992