TY  - BOOK
AU  - Sinclair,Robert
AU  - Smith,David J.
AU  - Dahmen,Ulrich
ED  - Materials Research Society
TI  - High resolution electron microscopy of defects in materials: symposium held April 16-18, 1990, San Francisco, California, U.S.A. 
T2  - Materials Research Society symposium proceedings,
SN  - 9781558990722
PY  - 1990///
CY  - Pittsburgh, Pa.
PB  - Materials Research Society
KW  - Materials
KW  - Microscopy
KW  - Congresses
KW  - Defects
KW  - High resolution electron microscopy
N1  - Includes bibliographical references and indexes
ER  -