Gan, Zhenghao <br/><br/>
Semiconductor process reliability in practice / 
Gan, Zhenghao, Wong Waisum and Liou Juin 
 - New York :  McGraw-Hill,  2013 
 - xv, 605 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780071754279 (hbk. : alk. paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Reliability