TY  - BOOK
AU  - Gan,Zhenghao
AU  - Wong,Waisum
AU  - Liou,Juin J.
TI  - Semiconductor process reliability in practice
SN  - 9780071754279 (hbk. : alk. paper)
PY  - 2013///
CY  - New York
PB  - McGraw-Hill
KW  - Semiconductors
KW  - Reliability
N1  - Includes bibliographical references and index
ER  -