Electron crystallography for materials research and quantitative characterization of nanostructured materials :  symposia held April 14-16, 2009, San Francisco, California, USA / 
editors, Peter Moeck .. [et al.] ; Symposium GG organizers, Peter Moeck ... [et al.] ; Symposium HH organizers, Frank (Bud) Bridges ... [et al.] 
 - Warrendale, PA :  Materials Research Society,  2009 
 - viii, 211 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings ;  v. 1184 .
 - Materials Research Society symposia proceedings ;  v. 1184 .
<br/><br/>Includes bibliographical references and indexes 
<br/><br/><label>ISBN: </label>1605111570 9781605111575 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystallography--Congresses<br/>Electron microscopy--Congresses<br/>Nanocrystals--Congresses