TY  - BOOK
AU  - Moeck,Peter
AU  - Bridges,Frank George Baskerville
ED  - Symposium GG, "Electron Crystallography for Materials Research"
ED  - Symposium HH, "Quantitative Characterization of Nanostructured Materials"
TI  - Electron crystallography for materials research and quantitative characterization of nanostructured materials: symposia held April 14-16, 2009, San Francisco, California, USA 
T2  - Materials Research Society symposium proceedings
SN  - 1605111570
PY  - 2009///
CY  - Warrendale, PA
PB  - Materials Research Society
KW  - Crystallography
KW  - Congresses
KW  - Electron microscopy
KW  - Nanocrystals
N1  - Includes bibliographical references and indexes
ER  -