Voinov, Vassiliy <br/><br/>
Chi-squared goodness of fit tests with applications / 
V. Voinov, M. Nikulin, N. Balakrishnan 
 - Amsterdam :  Elsevier/AP,  2013 
 - xii, 229 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780123971944 (hardback) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chi-square test<br/>Distribution (Probability theory)