TY  - BOOK
AU  - Maricau,Elie
AU  - Gielen,Georges
TI  - Analog IC reliability in nanometer CMOS
T2  - Analog circuits and signal processing
SN  - 9781461461623
PY  - 2013///
CY  - Heidelberg, Germany
PB  - Springer
KW  - Linear integrated circuits
KW  - Reliability
KW  - Metal oxide semiconductors, Complementary
N1  - Includes bibliographical references and index
ER  -