Performance and reliability of semiconductor devices :  symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. / 
editors, Michael Mastro ... [et al.] 
 - Warrendale, PA :  Materials Research Society,  2009 
 - xiii, 259 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings ;  v. 1108 .
 - Materials Research Society symposia proceedings ;  v. 1108 .
<br/><br/>Includes bibliographical references and indexes 
<br/><br/><label>ISBN: </label>9781605110806 1605110809 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Congresses<br/>Semiconductors--Defects--Congresses<br/>Semiconductors--Reliability--Congresses