TY  - BOOK
AU  - Mastro,Michael
ED  - Symposium A, "Performance and Reliability of Semiconductor Devices"
TI  - Performance and reliability of semiconductor devices: symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. 
T2  - Materials Research Society symposium proceedings
SN  - 9781605110806
PY  - 2009///
CY  - Warrendale, PA
PB  - Materials Research Society
KW  - Semiconductors
KW  - Congresses
KW  - Defects
KW  - Reliability
N1  - Includes bibliographical references and indexes
ER  -