Materials reliability in microelectronics II :  symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / 
editors by C. V. Thompson, J. R. Lloyd 
 - Pittsburgh, PA :  Materials Research Society,  c1992 
 - ix, 328 p. :  ill. ;  24 cm. 
 - Materials Research Society symposium proceedings ;  v. 265 .
 - Materials Research Society symposium proceedings .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781558991606 1558991603 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Reliability--Congresses<br/>Microelectronics--Materials--Testing--Congresses<br/>Electrodiffusion--Congresses<br/>Microstructure--Congresses--Congresses